Coarsening Dynamics of Crystalline Thin Films

Дата и время публикации : 1998-08-12T00:11:06Z

Авторы публикации и институты :
Martin Siegert

Ссылка на журнал-издание: Ссылка на журнал-издание не найдена
Коментарии к cтатье: RevTeX, 4 pages, 3 figures
Первичная категория: cond-mat.stat-mech

Все категории : cond-mat.stat-mech, cond-mat.mtrl-sci

Краткий обзор статьи: The formation of pyramid-like structures in thin-film growth on substrates with a quadratic symmetry, e.g., {001} surfaces, is shown to exhibit anisotropic scaling as there exist two length scales with different time dependences. Analytical and numerical results indicate that for most realizations coarsening of mounds is described by an exponent n=0.2357. However, depending on material parameters, n may lie between 0 (logarithmic coarsening) and 1/3. In contrast, growth on substrates with triangular symmetries ({111} surfaces) is dominated by a single length scale and an exponent n=1/3.

Category: Physics