Topological Defects in the Random-Field XY Model and the Pinned Vortex Lattice to Vortex Glass Transition in Type-II Superconductors

Дата и время публикации : 1996-01-25T20:45:38Z

Авторы публикации и институты :
Michel J. P. Gingras (TRIUMF)
David A. Huse (AT&T Bell Labs)

Ссылка на журнал-издание: Phys. Rev. B {53}, 15193 (1996)
Коментарии к cтатье: LATEX file; 5 Postscript figures are available from gingras@triumf.ca
Первичная категория: cond-mat

Все категории : cond-mat

Краткий обзор статьи: As a simplified model of randomly pinned vortex lattices or charge-density waves, we study the random-field XY model on square ($d=2$) and simple cubic ($d=3$) lattices. We verify in Monte Carlo simulations, that the average spacing between topological defects (vortices) diverges more strongly than the Imry-Ma pinning length as the random field strength, $H$, is reduced. We suggest that for $d=3$ the simulation data are consistent with a topological phase transition at a nonzero critical field, $H_c$, to a pinned phase that is defect-free at large length-scales. We also discuss the connection between the possible existence of this phase transition in the random-field XY model and the magnetic field driven transition from pinned vortex lattice to vortex glass in weakly disordered type-II superconductors.

Category: Physics